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X-ray diffraction at elevated temperatures a method for in situ process analysis
Language: English Publication details: New York VCH 1993Description: viii, 268ISBN:- 0471187267
Reference Books
| Item type | Current library | Home library | Collection | Call number | Status | Date due | Barcode | Item holds |
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Reference Books
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Science Library Reference Section | Science Library Reference Section | Reference Collection | 543.442.3 X61 (Browse shelf(Opens below)) | Available | 506769 |
Total holds: 0
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| 543.426 V14 Molecular fluorescence principles and applications | 543.427.4 T24 Principles of quantitative X-Ray fluorescence analysis | 543.429.23 T55 NMR spectroscopy and polymer microstructure the conformational connection | 543.442.3 X61 X-ray diffraction at elevated temperatures a method for in situ process analysis | 543.456 A28 Advanced fluorescence microscopy | 543.456 A28 Advanced fluorescence microscopy | 543.51 A28 Advances in mass spectrometry volume 12 |
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